A number of Technical Bulletins are available discussing both Electroluminescence and Photoluminescence Measurements for Photovoltaics.

For copies of these, as well as for information on this system, its range of options and configurations, including contactless quantative Photon Emission Image Analysis please contact: Left Coast Instruments

Download Reltron Solar Brochure

Download Reltron Fast EL Mapper Bulletin

Download Reltron EL Mapper Camera Options

Download ICS-1000 EL Tech Bulletin

Other Product Brochures, Data Sheets

Technical Bulletins

For more information please visit:

Reltrons Fast EL Mapper is a low-light mapping system equipped with a custom Relcam 4096 high resolution imaging module, designed for the rapid imaging of the low intensity emissions generated in forward-biased solar cells. Other camera options are available. For a comparison of available EL cameras please download -

Reltron EL Mapper Camera Options

The intensity of the emitted EL signal is a function of the electron-hole concentration, which is exponentially related to the applied forward bias voltage (the well known IV curve of a diode). Electroluminescence of photovoltaic devices provides valuable spatially-resolved details about efficiency-degrading mechanisms in the cell/panel that can result from:

• Minority Carrier Lifetime (diffusion length)
• Impurities and Defects that may result in Recombination Events
• EL Intensity Measurements
• Quantitative EL Image Analysis
• Dislocation Imaging
• Micro-cracks in the Cell -fastDetect Inspection is a tool to locate & sort cracks in crystalline solar cells. The system uses proprietary electroluminescence combined with machine vision inspection to identify the signatures of micro-cracks and other defects that cannot be visually detected. fastDetect can be used in Off-line and Inline applications
• Lateral Series Resistance
• Open circuits or discontinuities in conductors
• Polysilicon grain boundaries
• Relative Efficiency

Additional Metrics in the standard ICS -1000EL Software Suite include:

• Illuminated IV: IV curve, Isc, Voc, Pmax, Ipm, Vpm, Rs, Rsh, Eff, FF
• Dark IV: Rs, Rsh, Dark Current
• Temp Coefficent Calculations: Isc, Voc, Pmax
• Temperature monitoring using RTD/K-Dut / T-Dut

Applications of Electroluminescence include:

• Process Control
• Research and Development
• Inline Manufacturing
• Sorting and Grading

Electroluminescence Mapping is applicable to cells, arrays, and whole panels. Both Contact and Contactless measurement mapping is possible by radiating solar cells/modules with a specific wavelength of light and measuring the emitted photoluminescence signal.

Electroluminescence measurements provide fast and accurate qualitative and quantitative information about the performance of solar cells and modules. Such information is of great value for R&D, Manufacturing and Field Service functions.

The Fast EL Mapper can be configured for both the Macro and the Micro detection of spatially-resolved bandgap emissions found in CIGS, CIS, CdTe, Poly-Si, Si photovoltaics.