LEICA : TIC 020 Ion Beam Milling

Leica products are offered by Left Coast Instruments, Inc. under agreement with Marine Reef International

The Leica TIC 020 Triple Beam Ion Mill -

Microscopy requires fast and simple sample preparation methods to reveal internal structures near the surface whilst eliminating both mechanical damage and deformation.

The Leica Triple Beam Ion Mill enables high cutting speeds, combined with the ability to produce smooth surfaces suitable for micro-structural characterizations.

It is possible to achieve cross sections that are millimeters deep and several millimeters wide.

Conventional slope cutting systems require sample movement to reduce shadowing/curtaining induced by different sputtering rates for different materials, whereas the triple ion source used in the TIC 020 eliminates this requirement.