Leica: RES101

Leica products are offered by Left Coast Instruments, Inc. under agreement with Marine Reef International
The Leica RES 101 Ion Mill - Ion beam preparation for sample thinning, cleaning and in-situ coating in a single tool.
ALL - IN - ONE -
All ion beam preparation methods can be carried out in this single tool -
- TEM sample preparation with single or double sided low angle milling (down to 0°)
- SEM and Light Microscope sample preparation
- Surface Cleaning
- Surface Milling - for contrast enhancement
- Sample processing up to 25mm diameter
- 45° and 90° slope cutting for investigation of vertical structures
- In-situ coating of SEM & TEM samples by various target materials
- Various sample holders for different SEM, LM & TEM applications
Slope-Cutting of
Semiconductor die
Contrast enhancement
after ion milling
For information on this system and options and configuration available please contact: Left Coast Instruments
